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TTTC's Electronic Broadcasting Service |
20th IEEE Latin-American Test Symposium |
CALL FOR PAPERS
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The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and eld considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 20th LATS will be invited to re-submit to IEEE Design & Test,Journal of Electronic Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE (American Scienti c Publishers), and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). Topics of interest include but are not limited to:
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To encourage and facilitate discussions, participation will be limited. Those interested in presenting recent results at the symposium are invited to submit an extended abstract, one to three pages long, or a full length paper. PDF electronic submissions must be done via the symposium’s webpage: www.lats.tttc-events.org Authors should send papers in the IEEE format. Detailed instructions are available at the symposium’s webpage.
The Program Committee also welcomes proposals for panels and special topic sessions. |
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Submission Deadline (Title and Abstract): November 9th, 2018 Submission (Full paper): November 16th, 2018 Notification of Acceptance: December 20th, 2019 Camera Ready: January 10th, 2019 |
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| Additional Information | |
For additional information, please contact the Program Chair:
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| Committee | |
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General Co-Chairs: Raoul Velazco – TIMA, France Yervant Zorian – SYNOPSYS, USA Past General Chair: Fabian Vargas – PUCRS, Brazil Program Co-Chairs: Victor Champac – INOAE, Mexico Marcelo Lubaszewski, UFRGS, Brazil Local Chair: Victor Grimblatt – SYNOPSIS, Chile Local Arrangement Chair: Angel Abusleme – PUCC, Chile Special Session Co-Chairs: Matteo Sonza Reorda - POLITO, Italy Alberto Bosio - LIRMM, France Tutorial Co-Chairs: Paolo Rech, UFGRS, Brazil Luis Entrena, UC3M, Spain Panel Co-Chairs: E. Sanchez, POLITO, Italy S. Hamidioui, TU Delft, The Netherlands Finance Chair: Anne-L. Fourneret Itié – TIMA, France Publicity Co-Chairs: Argentina: Pablo Ferreyra – UNC, Argentina Brazil: Fernanda Kastendsmidt – UFRGS, Brazil Colombia: Felipe Restrepo Calle – UNAL, Colombia Central America: Alberto Chaves – DLR, Costa Rica Europe : Giorgio Di Natale – LIRMM, France TTEP Tutorials Liaison: Letíca Maria Bolzani Poehls – PUCRS, Brazil IEEE – CEDA Liaison: David Atienza – EPFL, Switzerland IEEE D&T Liaison: Kaushik Roy – Purdue Univ., USA JOLPE Liaison: Patrick Girard – LIRMM, France |
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| For more information, visit us on the web at: lats.tttc-events.org |
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The 20th IEEE Latin-American Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society-Test Technology Technical Council |
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